Height Measuring Instrument - Company Ranking(4 companyies in total)
Last Updated： Aggregation Period:Jul 09, 2025〜Aug 05, 2025
This ranking is based on the number of page views on our site.
Display Company Information
| Company Name | Featured Products | ||
|---|---|---|---|
| Product Image, Product Name, Price Range | overview | Application/Performance example | |
| 【Lineup (excerpt)】 ■KY-120-P type ■KY-120-TV type ■KY-90-TV type ■KY-90-P type ■KY-60-P type *For more details, please download the PDF or feel free to contact us. | For more details, please download the PDF or feel free to contact us. | ||
| 【Features】 ○ Changed the illumination of the projection slit, incident lighting, and reference slit to a combination of halogen and fiber optics. ○ Suitable for long measurement tasks with stable brightness in both area and spot illumination. ○ Large sample stage to accommodate larger measurement objects. | 【Applications】 ○ Height measurement of thick film ICs ○ Height measurement of sealants for adhesion ○ Variation in height displacement of lead frame pin tips ○ Height measurement of chamfer on the edge surface of discs | ||
| 【Features】 ○ Easy measurement while viewing the TV monitor screen ○ Vertical movement in the Z-axis ○ Fine adjustment in the Y' axis to measure uneven surfaces in 1μm increments ● For other functions and details, please contact us. | For more details, please contact us. | ||
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日商精密光学
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- Featured Products
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Micron Depth Height Measuring Machine
- overview
- 【Lineup (excerpt)】 ■KY-120-P type ■KY-120-TV type ■KY-90-TV type ■KY-90-P type ■KY-60-P type *For more details, please download the PDF or feel free to contact us.
- Application/Performance example
- For more details, please download the PDF or feel free to contact us.
Slit Intersecting Depth and Height Measuring Device
- overview
- 【Features】 ○ Changed the illumination of the projection slit, incident lighting, and reference slit to a combination of halogen and fiber optics. ○ Suitable for long measurement tasks with stable brightness in both area and spot illumination. ○ Large sample stage to accommodate larger measurement objects.
- Application/Performance example
- 【Applications】 ○ Height measurement of thick film ICs ○ Height measurement of sealants for adhesion ○ Variation in height displacement of lead frame pin tips ○ Height measurement of chamfer on the edge surface of discs
Light Cut-off Measurement Device Horizontal Micron Depth and Height Measuring Instrument
- overview
- 【Features】 ○ Easy measurement while viewing the TV monitor screen ○ Vertical movement in the Z-axis ○ Fine adjustment in the Y' axis to measure uneven surfaces in 1μm increments ● For other functions and details, please contact us.
- Application/Performance example
- For more details, please contact us.
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日商精密光学
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